An empirical method for the determination of wall perturbation factors for parallel-plate chambers in high-energy electron beams.

The calibration of ion chambers in high-energy electron beams in terms of absorbed dose to water at the National Physical Laboratory requires knowledge of the ratio of perturbation factors in graphite and water phantoms. During a review of data required for the NPL calibration procedure an empirical model was developed to calculate the perturbation due to the rear wall, pwall, of a well-guarded ion chamber in a high-energy electron beam. The overall uncertainty in this method is estimated to be 0.4%, which is the lowest value reported to date. The model reproduces measured data at the 0.1% level or better and indicates that the NACP ion chamber has a nonzero perturbation factor in electron beams due to backscatter from the rear wall. The effect is small (<0.5%) at high energies (R50>4 cm, E0>10 MeV) but becomes large at low energies-up to 1.4% at E0=4 MeV (R50=1.2 cm). The model indicates that there is a nonzero correction for the NACP chamber in both a graphite and water phantom and that material adjacent to the air cavity has a significant effect on the measured ionization. These values are consistent with previous measurements and recent Monte Carlo calculations. The model could be used in the design of ion chambers and in the estimation of corrections for non-homogeneous systems, especially in the absence of accurate Monte Carlo simulations.